Data Dictionary
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FPSINPUT Views
> FPSINPUT.WIP_WAFER_HIST_LOOP
View FPSAPP.MSOUI_APD_B_TOOL_RISK_WK_HIST
Gives the maximum wafers at risk by rule and tool for each week to be used by the Sampling Dashboard. This logic keeps the max at risk lot for each tool / rule combination regardless if there was metrology done or not.